Formatted trace records for events
The following sections describe different types of formatted trace records.
Time stamp records
Source index records
Lost event records
ADINT trace records
CCW trace records
CSCH and HSCH trace records
DSP and SDSP trace records
EOS, INTG, IO, IOCS, and PCI trace records
EXT trace records
FRR trace records
HEXFORMAT, SUBSYS, and SYSTEM trace records
IOX trace records
LSR trace records
MSCH trace records
PCIDMX trace records
PCILG trace records
PCISTG trace records
PGM and PI trace records
RNIO trace records
RSCH trace records
SLIP trace records
SLIP standard trace record
SLIP standard/user trace record
SLIP user trace record
SLIP debug trace record
SRB trace records
SRM trace records
SSCH trace records
STAE trace records
SVC and SVCR trace records
TCW trace records
USR trace records
Unformatted USR trace record
Formatted USR trace record
USRF9 trace record for VSAM
USRFD trace record for VTAM
USRFE trace record for BSAM, QSAM, BPAM, and BDAM
USRFF trace record for open/close/EOV abnormal end
USRFF trace record for user requested work area
XSCH trace record
Event Identifiers (EIDs) for USR trace records
Format Identifiers (FIDs) for USR trace records
Parent topic:
The Generalized Trace Facility (GTF)